We have just completed the move of RAN Science & Technology, LLC, from Rolling Hills Estates, California, to our new offices in Palos Verdes Estates, California (about four miles).  Online information remains the same.

On Wednesday, July 27th, I will be making a presentation on “Enhanced Surface Metrology” at the annual Coordinate Metrology Society Conference, http://www.cmsc.org. The 4-day conference is taking place at the Arizona Biltmore in Phoenix, and in the absence of any new dust storm, it is measuring up to be just a hot event.

This comes off the heels of the publication of my paper, “Improving the Accuracy of Surface Metrology,”  in the July issue of “Optical Engineering.” Addressing the constant search for more accurate measurement, the paper presents a method of using statistical sampling to improve metrological accuracy without the undesirable effects of higher cost, greater complexity, or devices that do not lend themselves to manufacturing environments. It can be used to improve the accuracy of a wide range of metrology systems.